时间：2022年8月1日（周一） 15:00-16:30

Time: 15:00-16:30, Monday, August 1, 2022

地点：西湖大学云栖校区2号楼611室

Venue: Room 611, 6F, Building 2, Yunqi Campus

主持人: 西湖大学材料科学讲席教授 黄嘉兴

Host: Dr. Jiaxing Huang, Chair Professor, Westlake University

主讲嘉宾/Speaker：

Prof. Yu Han 韩宇

King Abdullah University of Science and Technology

阿卜杜拉国王科技大学

主讲人简介/Biography:

Dr. Han is a materials chemist and his research focuses on nanoporous and nanostructured materials for novel applications in gas adsorption/separation, heterogeneous catalysis, and nanophotonics. Dr. Han is also known for his contributions to the development of ultralow-dose electron microscopy methods, which, for the first time, achieved atomic-resolution imaging of extremely sensitive materials including MOFs, COFs, supramolecular structures and hybrid perovskites. Dr. Han has published > 300 articles in prestigious journals including Science, Nature, Nature Materials, Nature Chemistry, Nature Catalysis, Nature Nanotechnology, Nature Communications, JACS, and these papers have been cited over 35,000 times with h-index of 92 (google scholar, as of June 2022). His achievements have garnered international recognition. In 2004, he was named as a TR100 Young Innovator by the MIT’s magazine of innovation, Technology Review. In 2006, he was awarded the Young Scientist Award by the Singapore National Academy of Science. In 2016, he got the Cheung Kong Scholar award, the highest academic award issued to an individual by the Ministry of Education of the People's Republic of China. In 2021, he received the Humboldt research award. He is the Fellow of Royal Society of Chemistry (FRSC) and designated by Clarivate as a Highly Cited Researcher in 2019-2021.

讲座摘要/Abstract:

This presentation will focus on our recent works pertaining to the high-resolution imaging of electron beam-sensitive materials using ultralow electron doses. The following technological advances will be discussed. First, the development of a suite of methods to address the challenges peculiar to low-dose TEM imaging, including rapid search for crystal zone axes, precise alignment of the image stack, and accurate determination of the defocus value, enables efficient imaging of electron beam-sensitive crystalline materials in the high-resolution TEM (HRTEM) mode. Second, integrated differential phase contrast STEM (iDPC-STEM) has proven to be an effective method for acquiring directly interpretable atomic-resolution images under low-dose conditions. Third, cryogenic focused ion beam (cryo-FIB) has demonstrated a unique power to prepare (S)TEM specimens for highly sensitive materials. Finally, I will share my views on the great potential of four-dimensional STEM (4D-STEM) in imaging highly electron beam-sensitive materials and provide preliminary results to demonstrate its feasibility.

讲座联系人/Contact:

jiaxing-huang@westlake.edu.cn